IEEE International On-Line Testing Symposium

Страна: Испания

Город: Platja d’Aro

Тезисы до: 14.02.2018

Даты: 02.07.18 — 04.07.18

Область наук: Технические;

Е-мейл Оргкомитета: dgizop@di.uoa.gr

Организаторы: IEEE

 

Issues related to On-line testing techniques, and more generally to design for robustness, are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective design for robustness techniques. These needs have increased dramatically with the introduction of nanometer technologies, which impact adversely noise margins; process, voltage and temperature variations; aging and wear-out; soft error and EMI sensitivity; power density and heating; and make mandatory the use of design for robustness techniques for extending, yield, reliability, and lifetime of modern SoCs. Design for reliability becomes also mandatory for reducing power dissipation, as voltage reduction, often used to reduce power, strongly affects reliability by reducing noise margins and thus the sensitivity to soft-errors and EMI, and by increasing circuit delays and thus the severity of timing faults. There is also a strong relation between Design for Reliability and Design for Security, as security attacks are often fault-based.

The International Symposium on On-Line Testing and Robust System Design (IOLTS), is an established forum for presenting novel ideas and experimental data on these areas. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2018 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.
The topics of interest include (but are not limited to) the following ones:

    Quality, yield, reliability and lifespan issues in nanometer technologies
    Variability, aging, EMI, and radiation effects in nanometer technologies
    Self-test and self-repair
    Design-for-Reliability
    On-line testing techniques for digital, analog and mixed-signal circuits
    Self-checking circuits and coding theory
    On-line monitoring of current, temperature, process variations, and aging
    Self-healing design
    Self-regulating design
    Self-adapting design
    Cross-layer reliability approaches
    Reliability issues of Low-Power Design
    Design for Reliability approaches for Low-Power
    Power density and overheating issues in nanometer technologies
    Fault-tolerant and fail-safe systems
    Dependable system design
    Field diagnosis, maintainability, and reconfiguration
    Design for security
    Fault-based attacks and counter measures
    Design for Robustness for automotive, railway, avionics, space, large industrial applications, IT infrastructure, cloud computing, and wired, cellular and satellite communications
    Robustness evaluation
    CAD for robust circuits design

 

Веб-сайт конференции: http://tima.univ-grenoble-alpes.fr/conferences/iolts/iolts18/

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