17 - 21 May 2010 At Monte Verita, Locarno, Switzerland

Страна: Швейцария

Город:

Тезисы до: 18.10.2009

Даты: 06.10.09 — 06.10.09

Область наук: Физико-математические;

Организаторы: At Monte Verita, Locarno

 

The Conference Chairs, Prof. Pramod Rastogi and Dr Erwin Hack invite you to Switzerland to be a part of the Conference on Advanced Phase Measurement Methods in Optics and Imaging which will be held at Monte Verita, Locarno, between 17 and 21 May 2010.

The main conference objectives are to:

stimulate discussion among different branches of metrology
further the understanding of the general concept of phase
present the state of the art through key note and invited lectures
discuss emerging research topics and trends

The stimulating and unique ambiance of Monte Verita is chosen to organize a conference with a familiar and scientifically inspiring fragrance. It is intended to have invited papers to start each session. Only plenary lectures are planned to guarantee open and broad discussions.

Two types of contributions are solicited:

Original research contributions (20 min)
Short presentations (12 min) on timely topics

Веб-сайт конференции: http://phasemeas2010.epfl.ch/index.htm

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