Aberration Corrected Transmission Electron Microscopy

Країна: N/A

Місто: N/A

Тези до: 01.08.2016

Дати: 01.08.16 — 01.08.16

Е-мейл Оргкомітету: jmr@mrs.org

Організатори: Materials Research Society

 

ч    Spherical and chromatic aberration correctors in transmission and in scanning transmission electron microscopes (TEM/STEM) have become commercially available in recent years. They are comprised of electromagnetic multipoles driven by ultra-stable power supplies in conjunction with faster and more efficient hard- and software for image acquisition, analysis and alignment. This technology has significantly improved the spatial resolution, down to the size of the Bohr radius under certain conditions so that the atomic scattering in the sample can limit the resolution, rather than the microscope.

    Focus now needs to shift towards new scientific areas that can be addressed with this novel equipment, taking into account the improved resolution, reduced thermal drift, novel electron detectors, and larger pole-piece gaps, due directly or indirectly to the advent of aberration correction. The parameter space for operation has become much more complex, so operators need to carefully plan experiments to find the best way to extract meaningful data. In particular, the high voltage should be optimized to minimize radiation damage. Better resolution may involve higher electron doses but imply more beam damage. Increased stability allows fast experiments with highly focused electron probes. More sensitive detectors can be used to test new data acquisition schemes as well as to reduce the electron dose. Consideration must be given as to whether the fascinating in-situ studies of the kinetics of atomic growth mechanisms now possible will allow meaningful inference to be drawn on thermodynamic properties representative of the bulk. In-operando studies of specimens in their engineered application environment (i.e. in gaseous or liquid atmosphere, under electrical bias, strain, illumination, etc.) can be conducted at nano-scale resolution.

    This Focus Issue will include imaging, spectroscopy, and diffraction based (S)TEM applications to materials science problems with planar or focused illumination.

Contributed articles are particularly sought in the following areas:

    Resolution vs. quantification issues in quantitative high-resolution imaging
    Quantitative spectroscopy for local measurements of chemistry or electronic properties
    Limitations due to radiation damage
    Comparing studies by planar and focused illumination: evaluating dose vs. dose rate effects
    Applications of chromatic aberration correction, monochromation, and low energy studies
    Applications of improved electron detectors and novel acquisition schemes
    In-situ strain measurements and in-operando catalysis studies
 

Веб-сторінка конференції: http://www.mrs.org/jmr-focus-aberration-tem/

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