METROMEET 16th International Conference on Industrial Dimensional Metrology

Країна: Іспанія

Місто: Bilbao

Тези до: 01.10.2019

Дати: 26.02.20 — 28.02.20

Область наук: Технічні;

Е-мейл Оргкомітету:


Умови участі та проживання: Free of charge for speakers


Metromeet 2020 Topics:

  • Quality Control
  • Metrology solutions for industry (automotive, aeronautics, plastics, etc.)
  • Calibration and Verification
  • Additive Manufacturing
  • Advances of micro- and nanometrology
  • Future Metrology tendencies
  • Nanoindentation
  • Latest developments and solutions in the area of optical non-contact measurement and 3D digitalisation systems
  • Quality control for micromanufacturing and micromachining
  • Advances and trends in the design of CMMs
  • Recent developments in the area of metrological software
  • Solutions for in-line inspection
  • State of the art and challenges of multi-sensor coordinate metrology
  • Uncertainty traceability and reliability of measurements with CMMs
  • Accreditation, certification and general standards

Веб-сторінка конференції: